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Wyko NT9300 Optical Profiler - Bruker - US |
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 Enhanced metrology performance, versatility and value
The Wyko NT9300 employs coherence scanning interferometry (also known as white-light interferometry, white-light confocal, or vertical scanning interferometry) to produce high-quality 3D surface maps. You get fast, accurate surface topography, increased intensity and longer source lifetime.
The Wyko NT9300 optical profiler is a high performance workhorse for laboratory research and production floor monitoring, with features that are ideal for operators of any skill level; plus the extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
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http://www.bruker-axs.com/stylus_and_optical_metrology.html |
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Wyko NT9800 Optical Profiler - Bruker - US |
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 The highest perfomance in 3D non-contact metrology
With the Wyko NT9800 Optical Profiler, you get rapid, non-contact, 3D measurements with sub-nanometer resolution, plus internal laser reference for self-calibration and adjustments.
The Wyko NT9800 optical profiler employs coherence scanning interferometry, also known as white-light confocal interferometry, to produce high quality three-dimensional surface maps.
Its combination of advanced features, proven metrology core, and available application-specific software routines make it an ideal metrology solution for devices like MEMS, metals, materials, semiconductors, medical devices and more.
Download Brochure
http://www.bruker-axs.com/stylus_and_optical_metrology.html |
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Wyko NT9100 Optical Profiler - Bruker - US |
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 Accurate, affordable metrology with a small footprint
The Wyko NT9100 Optical Profiling System provides cost-effective convenience and performance – including accurate surface topography with a small footprint -- for quality noncontact three-dimensional surface metrology.
The Wyko NT9100 Optical Profile employs coherence scanning interferometry, also known as white-light interferometry, white-light confocal, or vertical scanning interferometry to produce high quality three-dimensional surface maps of the object under test.
The NEW NT9100S model for photovoltaic (PV) metrology combines nanometer Z-height resolution with millimeter fields of view, providing solar cell manufacturers unprecedented capability to monitor and control surface texture, and to match specific surface measurements to cell efficiency.
Download Brochure
http://www.bruker-axs.com/stylus_and_optical_metrology.html |
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