The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films.

The system’s impressive step height repeatability and vertical range, plus its overhead gantry design, give it great versatility. And the exclusive Dektak N•Lite™ low force sensor option allows easier measurement of soft materials and characterization of sub-micron lines and spaces.

http://www.bruker-axs.com/stylus_and_optical_metrology.html

High performance repeatability, versatility and value in a single system

Industry-leading performance, repeatability, and standard scanning range size are all built into the Dektak 150+ Surface Profiler – the culmination of four decades of stylus profiler technology innovations.

The Dektak 150+ Surface Profiler offers a variety of configurations and add-on options for superior repeatability, programmability, low-force characterization, and detailed analysis. For power, performance, and reliability, there has never been a more complete profiler at a better price.

Download Brochure
http://www.bruker-axs.com/stylus_and_optical_metrology.html