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Dektak 8 Surface Profiler - Bruker - US |
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The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films.
The system’s impressive step height repeatability and vertical range, plus its overhead gantry design, give it great versatility. And the exclusive Dektak N•Lite™ low force sensor option allows easier measurement of soft materials and characterization of sub-micron lines and spaces.
http://www.bruker-axs.com/stylus_and_optical_metrology.html |
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Dektak 150+ Surface Profiler - Bruker - US |
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High performance repeatability, versatility and value in a single system
Industry-leading performance, repeatability, and standard scanning range size are all built into the Dektak 150+ Surface Profiler – the culmination of four decades of stylus profiler technology innovations.
The Dektak 150+ Surface Profiler offers a variety of configurations and add-on options for superior repeatability, programmability, low-force characterization, and detailed analysis. For power, performance, and reliability, there has never been a more complete profiler at a better price.
Download Brochure http://www.bruker-axs.com/stylus_and_optical_metrology.html
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